Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application.
- DOI
- 10.3390/mi14112098
- Published
- 2023 Nov 14
- Container
- Micromachines
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/mi14112098,
title = {Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application.},
author = {Dong D and Lai J and Yang Y and Gong T and Zheng X and Sun W and Yu J and Fan S and Xu X},
year = {2023},
journal = {Micromachines},
doi = {10.3390/mi14112098},
url = {https://doi.org/10.3390/mi14112098}
}RIS
TY - JOUR TI - Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application. AU - Dong D AU - Lai J AU - Yang Y AU - Gong T AU - Zheng X AU - Sun W AU - Yu J AU - Fan S AU - Xu X PY - 2023 JO - Micromachines DO - 10.3390/mi14112098 UR - https://doi.org/10.3390/mi14112098 ER -
APA
D, D., J, L., Y, Y., T, G., X, Z., W, S., J, Y., S, F., & X, X. (2023). Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application.. Micromachines. https://doi.org/10.3390/mi14112098
Source records
- pubmed · retrieved 2026-09-25T20:35:27.008Z