Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application
- DOI
- 10.3390/mi14112098
- Published
- 11
- Container
- Micromachines
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/mi14112098,
title = {Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application},
author = {Danian Dong and Jinru Lai and Yan Yang and Tiancheng Gong and Xu Zheng and Wenxuan Sun and Jie Yu and Shaoyang Fan and Xiaoxin Xu},
year = {2023},
journal = {Micromachines},
doi = {10.3390/mi14112098},
url = {https://doi.org/10.3390/mi14112098}
}RIS
TY - JOUR TI - Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application AU - Danian Dong AU - Jinru Lai AU - Yan Yang AU - Tiancheng Gong AU - Xu Zheng AU - Wenxuan Sun AU - Jie Yu AU - Shaoyang Fan AU - Xiaoxin Xu PY - 2023 JO - Micromachines DO - 10.3390/mi14112098 UR - https://doi.org/10.3390/mi14112098 ER -
APA
Dong, D., Lai, J., Yang, Y., Gong, T., Zheng, X., Sun, W., Yu, J., Fan, S., & Xu, X. (2023). Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application. Micromachines. https://doi.org/10.3390/mi14112098
Source records
- doaj · retrieved 2026-11-10T07:23:39.216Z