Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits

Boris V. Malozyomov, Nikita V. Martyushev, Natalia Nikolaevna Bryukhanova, Viktor V. Kondratiev, Roman V. Kononenko, Pavel P. Pavlov, Victoria V. Romanova, Yuliya I. Karlina

Open source

DOI: 10.3390/mi15050561
Published: 2024-04-24
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi15050561,
  title = {Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits},
  author = {Boris V. Malozyomov and Nikita V. Martyushev and Natalia Nikolaevna Bryukhanova and Viktor V. Kondratiev and Roman V. Kononenko and Pavel P. Pavlov and Victoria V. Romanova and Yuliya I. Karlina},
  year = {2024},
  journal = {Micromachines},
  doi = {10.3390/mi15050561},
  url = {https://doi.org/10.3390/mi15050561}
}

RIS

TY  - JOUR
TI  - Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits
AU  - Boris V. Malozyomov
AU  - Nikita V. Martyushev
AU  - Natalia Nikolaevna Bryukhanova
AU  - Viktor V. Kondratiev
AU  - Roman V. Kononenko
AU  - Pavel P. Pavlov
AU  - Victoria V. Romanova
AU  - Yuliya I. Karlina
PY  - 2024
JO  - Micromachines
DO  - 10.3390/mi15050561
UR  - https://doi.org/10.3390/mi15050561
ER  -

APA

Malozyomov, B. V., Martyushev, N. V., Bryukhanova, N. N., Kondratiev, V. V., Kononenko, R. V., Pavlov, P. P., Romanova, V. V., & Karlina, Y. I. (2024). Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. Micromachines. https://doi.org/10.3390/mi15050561

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crossref · retrieved 2026-09-25T08:26:27.565Z