Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices.

Ren Y, Zhu M, Dai X, Li L, Liu M

Open source

DOI: 10.3390/mi16040434
Published: 2025 Apr 2
Container: Micromachines
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/mi16040434,
  title = {Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices.},
  author = {Ren Y and Zhu M and Dai X and Li L and Liu M},
  year = {2025},
  journal = {Micromachines},
  doi = {10.3390/mi16040434},
  url = {https://doi.org/10.3390/mi16040434}
}

RIS

TY  - JOUR
TI  - Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices.
AU  - Ren Y
AU  - Zhu M
AU  - Dai X
AU  - Li L
AU  - Liu M
PY  - 2025
JO  - Micromachines
DO  - 10.3390/mi16040434
UR  - https://doi.org/10.3390/mi16040434
ER  -

APA

Y, R., M, Z., X, D., L, L., & M, L. (2025). Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices.. Micromachines. https://doi.org/10.3390/mi16040434

Source records

pubmed · retrieved 2026-09-26T11:42:04.073Z
europe-pmc · retrieved 2026-09-26T11:42:04.078Z
doaj · retrieved 2026-09-26T11:42:04.047Z