SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation

Alex Metreveli, Anders Hallén, Carl-Mikael Zetterling

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DOI: 10.3390/mi16111246
Published: 2025-10-31
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi16111246,
  title = {SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation},
  author = {Alex Metreveli and Anders Hallén and Carl-Mikael Zetterling},
  year = {2025},
  journal = {Micromachines},
  doi = {10.3390/mi16111246},
  url = {https://doi.org/10.3390/mi16111246}
}

RIS

TY  - JOUR
TI  - SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation
AU  - Alex Metreveli
AU  - Anders Hallén
AU  - Carl-Mikael Zetterling
PY  - 2025
JO  - Micromachines
DO  - 10.3390/mi16111246
UR  - https://doi.org/10.3390/mi16111246
ER  -

APA

Metreveli, A., Hallén, A., & Zetterling, C. (2025). SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation. Micromachines. https://doi.org/10.3390/mi16111246

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crossref · retrieved 2026-09-25T11:25:11.624Z