Research on an Improved YOLOv8 Detection Method for Surface Defects of Optical Components

Bei Ma, Jialong Zhao, Shun Zhou, Hongjun Wang, Junqi Xu, Bingcai Liu, Jingyao Hou, Weiguo Liu

Open source

DOI: 10.3390/mi16121373
Published: 2025-12-01
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi16121373,
  title = {Research on an Improved YOLOv8 Detection Method for Surface Defects of Optical Components},
  author = {Bei Ma and Jialong Zhao and Shun Zhou and Hongjun Wang and Junqi Xu and Bingcai Liu and Jingyao Hou and Weiguo Liu},
  year = {2025},
  journal = {Micromachines},
  doi = {10.3390/mi16121373},
  url = {https://doi.org/10.3390/mi16121373}
}

RIS

TY  - JOUR
TI  - Research on an Improved YOLOv8 Detection Method for Surface Defects of Optical Components
AU  - Bei Ma
AU  - Jialong Zhao
AU  - Shun Zhou
AU  - Hongjun Wang
AU  - Junqi Xu
AU  - Bingcai Liu
AU  - Jingyao Hou
AU  - Weiguo Liu
PY  - 2025
JO  - Micromachines
DO  - 10.3390/mi16121373
UR  - https://doi.org/10.3390/mi16121373
ER  -

APA

Ma, B., Zhao, J., Zhou, S., Wang, H., Xu, J., Liu, B., Hou, J., & Liu, W. (2025). Research on an Improved YOLOv8 Detection Method for Surface Defects of Optical Components. Micromachines. https://doi.org/10.3390/mi16121373

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crossref · retrieved 2026-09-25T06:57:52.181Z