YOLO-LA: Prototype-Based Vision-Language Alignment for Silicon Wafer Defect Pattern Detection.

Wang Z, Yang Y, Chu J, Zang Y, She Z, Fang W, Wang R.

Open source

DOI
10.3390/mi17010067
Published
2025-12-31
Container
Micromachines (Basel)
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.3390/mi17010067,
  title = {YOLO-LA: Prototype-Based Vision-Language Alignment for Silicon Wafer Defect Pattern Detection.},
  author = {Wang Z and  Yang Y and  Chu J and  Zang Y and  She Z and  Fang W and  Wang R.},
  year = {2025},
  journal = {Micromachines (Basel)},
  doi = {10.3390/mi17010067},
  url = {https://doi.org/10.3390/mi17010067}
}

RIS

TY  - JOUR
TI  - YOLO-LA: Prototype-Based Vision-Language Alignment for Silicon Wafer Defect Pattern Detection.
AU  - Wang Z
AU  -  Yang Y
AU  -  Chu J
AU  -  Zang Y
AU  -  She Z
AU  -  Fang W
AU  -  Wang R.
PY  - 2025
JO  - Micromachines (Basel)
DO  - 10.3390/mi17010067
UR  - https://doi.org/10.3390/mi17010067
ER  -

APA

Z, W., Y, Y., J, C., Y, Z., Z, S., W, F., & R., W. (2025). YOLO-LA: Prototype-Based Vision-Language Alignment for Silicon Wafer Defect Pattern Detection.. Micromachines (Basel). https://doi.org/10.3390/mi17010067

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