Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor
- DOI
- 10.3390/mi17010132
- Published
- 2026-01-20
- Container
- Micromachines
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/mi17010132,
title = {Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor},
author = {Yi Liu and Yuchen Liu and Xinfang Liao and Changqing Xu and Yangchen He and Yintang Yang},
year = {2026},
journal = {Micromachines},
doi = {10.3390/mi17010132},
url = {https://doi.org/10.3390/mi17010132}
}RIS
TY - JOUR TI - Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor AU - Yi Liu AU - Yuchen Liu AU - Xinfang Liao AU - Changqing Xu AU - Yangchen He AU - Yintang Yang PY - 2026 JO - Micromachines DO - 10.3390/mi17010132 UR - https://doi.org/10.3390/mi17010132 ER -
APA
Liu, Y., Liu, Y., Liao, X., Xu, C., He, Y., & Yang, Y. (2026). Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor. Micromachines. https://doi.org/10.3390/mi17010132
Source records
- crossref · retrieved 2026-09-26T14:54:39.717Z