MM-WAE: Multimodal Wasserstein Autoencoders for Semi-Supervised Wafer Map Defect Recognition

Yifeng Zhang, Qingqing Sun, Ziyu Liu, David Wei Zhang

Open source

DOI: 10.3390/mi17030367
Published: 2026-03-18
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi17030367,
  title = {MM-WAE: Multimodal Wasserstein Autoencoders for Semi-Supervised Wafer Map Defect Recognition},
  author = {Yifeng Zhang and Qingqing Sun and Ziyu Liu and David Wei Zhang},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17030367},
  url = {https://doi.org/10.3390/mi17030367}
}

RIS

TY  - JOUR
TI  - MM-WAE: Multimodal Wasserstein Autoencoders for Semi-Supervised Wafer Map Defect Recognition
AU  - Yifeng Zhang
AU  - Qingqing Sun
AU  - Ziyu Liu
AU  - David Wei Zhang
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17030367
UR  - https://doi.org/10.3390/mi17030367
ER  -

APA

Zhang, Y., Sun, Q., Liu, Z., & Zhang, D. W. (2026). MM-WAE: Multimodal Wasserstein Autoencoders for Semi-Supervised Wafer Map Defect Recognition. Micromachines. https://doi.org/10.3390/mi17030367

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crossref · retrieved 2026-11-10T06:38:35.760Z