Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash.

Park Y, Shim W

DOI: 10.3390/mi17040399
Published: 2026 Mar 25
Container: Micromachines
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/mi17040399,
  title = {Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash.},
  author = {Park Y and Shim W},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17040399},
  url = {https://doi.org/10.3390/mi17040399}
}

RIS

TY  - JOUR
TI  - Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash.
AU  - Park Y
AU  - Shim W
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17040399
UR  - https://doi.org/10.3390/mi17040399
ER  -

APA

Y, P., & W, S. (2026). Incremental Pulse-Width Erase (IPWE) Scheme for Fast and Variation-Tolerant GIDL Erase of 3D NAND Flash.. Micromachines. https://doi.org/10.3390/mi17040399

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pubmed · retrieved 2026-09-25T01:45:34.871Z