A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices.

Chen Y, Huang J, Zeng Y, Jiang Y, Wang S, Chen S, Liu H.

Open source

DOI: 10.3390/mi17040452
Published: 2026-04-07
Container: Micromachines (Basel)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/mi17040452,
  title = {A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices.},
  author = {Chen Y and  Huang J and  Zeng Y and  Jiang Y and  Wang S and  Chen S and  Liu H.},
  year = {2026},
  journal = {Micromachines (Basel)},
  doi = {10.3390/mi17040452},
  url = {https://doi.org/10.3390/mi17040452}
}

RIS

TY  - JOUR
TI  - A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices.
AU  - Chen Y
AU  -  Huang J
AU  -  Zeng Y
AU  -  Jiang Y
AU  -  Wang S
AU  -  Chen S
AU  -  Liu H.
PY  - 2026
JO  - Micromachines (Basel)
DO  - 10.3390/mi17040452
UR  - https://doi.org/10.3390/mi17040452
ER  -

APA

Y, C., J, H., Y, Z., Y, J., S, W., S, C., & H., L. (2026). A Universal Deep Learning Model for Predicting Detection Performance and Single-Event Effects of SPAD Devices.. Micromachines (Basel). https://doi.org/10.3390/mi17040452

Source records

europe-pmc · retrieved 2026-09-25T06:35:08.753Z
doaj · retrieved 2026-09-25T06:35:08.774Z