Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”

Changqing Xu, Yi Liu, Yiqiang Chen

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DOI: 10.3390/mi17070841
Published: 2026-07-15
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi17070841,
  title = {Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”},
  author = {Changqing Xu and Yi Liu and Yiqiang Chen},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17070841},
  url = {https://doi.org/10.3390/mi17070841}
}

RIS

TY  - JOUR
TI  - Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”
AU  - Changqing Xu
AU  - Yi Liu
AU  - Yiqiang Chen
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17070841
UR  - https://doi.org/10.3390/mi17070841
ER  -

APA

Xu, C., Liu, Y., & Chen, Y. (2026). Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”. Micromachines. https://doi.org/10.3390/mi17070841

Source records

crossref · retrieved 2026-09-24T19:49:09.472Z