Correlation Between Geometric Parameters and Capacitance in Silicon Detectors: A Study Based on Physical Modeling, Simulation, and Experiment.

Li X, Long T, Zhao J, Lu S, Xiao Y, Li Z

Open source

DOI
10.3390/mi17080888
Published
2026 Jul 25
Container
Micromachines
Publisher
Not recorded
Open access
yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.3390/mi17080888,
  title = {Correlation Between Geometric Parameters and Capacitance in Silicon Detectors: A Study Based on Physical Modeling, Simulation, and Experiment.},
  author = {Li X and Long T and Zhao J and Lu S and Xiao Y and Li Z},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17080888},
  url = {https://doi.org/10.3390/mi17080888}
}

RIS

TY  - JOUR
TI  - Correlation Between Geometric Parameters and Capacitance in Silicon Detectors: A Study Based on Physical Modeling, Simulation, and Experiment.
AU  - Li X
AU  - Long T
AU  - Zhao J
AU  - Lu S
AU  - Xiao Y
AU  - Li Z
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17080888
UR  - https://doi.org/10.3390/mi17080888
ER  - 

APA

X, L., T, L., J, Z., S, L., Y, X., & Z, L. (2026). Correlation Between Geometric Parameters and Capacitance in Silicon Detectors: A Study Based on Physical Modeling, Simulation, and Experiment.. Micromachines. https://doi.org/10.3390/mi17080888

Source records