Electrical Characterization of Mesh-Structured Floating-Gate Neuromorphic Transistors with Varying Mesh Sizes
- DOI
- 10.3390/mi17080967
- Published
- 2026-08-16
- Container
- Micromachines
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/mi17080967,
title = {Electrical Characterization of Mesh-Structured Floating-Gate Neuromorphic Transistors with Varying Mesh Sizes},
author = {Taehwan Koo and Hyeongjin Chae and Kangmin Yoo and Hyeonseok Jeong and Juyeong Chae and Dongyeop Kim and Jineui Park and Moongyu Jang},
year = {2026},
journal = {Micromachines},
doi = {10.3390/mi17080967},
url = {https://doi.org/10.3390/mi17080967}
}RIS
TY - JOUR TI - Electrical Characterization of Mesh-Structured Floating-Gate Neuromorphic Transistors with Varying Mesh Sizes AU - Taehwan Koo AU - Hyeongjin Chae AU - Kangmin Yoo AU - Hyeonseok Jeong AU - Juyeong Chae AU - Dongyeop Kim AU - Jineui Park AU - Moongyu Jang PY - 2026 JO - Micromachines DO - 10.3390/mi17080967 UR - https://doi.org/10.3390/mi17080967 ER -
APA
Koo, T., Chae, H., Yoo, K., Jeong, H., Chae, J., Kim, D., Park, J., & Jang, M. (2026). Electrical Characterization of Mesh-Structured Floating-Gate Neuromorphic Transistors with Varying Mesh Sizes. Micromachines. https://doi.org/10.3390/mi17080967
Source records
- crossref · retrieved 2026-11-10T06:44:13.138Z