Reliability-Oriented Multi-Class Fault-Injection Acceleration for Digital Integrated Circuits via Heterogeneous Spatio-Temporal Graph Learning.
- DOI
- 10.3390/mi17091059
- Published
- 2026 Sep 4
- Container
- Micromachines
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/mi17091059,
title = {Reliability-Oriented Multi-Class Fault-Injection Acceleration for Digital Integrated Circuits via Heterogeneous Spatio-Temporal Graph Learning.},
author = {Lu J and Xu C and Peng H and Zhang G and Wang L and Liao X and Liu Y and Yang Y},
year = {2026},
journal = {Micromachines},
doi = {10.3390/mi17091059},
url = {https://doi.org/10.3390/mi17091059}
}RIS
TY - JOUR TI - Reliability-Oriented Multi-Class Fault-Injection Acceleration for Digital Integrated Circuits via Heterogeneous Spatio-Temporal Graph Learning. AU - Lu J AU - Xu C AU - Peng H AU - Zhang G AU - Wang L AU - Liao X AU - Liu Y AU - Yang Y PY - 2026 JO - Micromachines DO - 10.3390/mi17091059 UR - https://doi.org/10.3390/mi17091059 ER -
APA
J, L., C, X., H, P., G, Z., L, W., X, L., Y, L., & Y, Y. (2026). Reliability-Oriented Multi-Class Fault-Injection Acceleration for Digital Integrated Circuits via Heterogeneous Spatio-Temporal Graph Learning.. Micromachines. https://doi.org/10.3390/mi17091059
Source records
- pubmed · retrieved 2026-09-26T19:54:43.916Z