Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics

Liron Cohen, Lidor Bazon, Joseph B. Bernstein

Open source

DOI: 10.3390/mi17101116
Published: 2026-09-24
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi17101116,
  title = {Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics},
  author = {Liron Cohen and Lidor Bazon and Joseph B. Bernstein},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17101116},
  url = {https://doi.org/10.3390/mi17101116}
}

RIS

TY  - JOUR
TI  - Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics
AU  - Liron Cohen
AU  - Lidor Bazon
AU  - Joseph B. Bernstein
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17101116
UR  - https://doi.org/10.3390/mi17101116
ER  -

APA

Cohen, L., Bazon, L., & Bernstein, J. B. (2026). Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics. Micromachines. https://doi.org/10.3390/mi17101116

Source records

crossref · retrieved 2026-11-08T09:10:56.596Z