Fault Mechanism Analysis of MEMS Gyroscopes Under High-Overload Environment

Bin Yan, Zhongyang Guo, Yilong Chen, Jiantao Zhao, Yujun Yang, Shugang Zhang, Boyu Hao, Huiliang Cao

Open source

DOI: 10.3390/mi17101206
Published: 2026-10-21
Container: Micromachines
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/mi17101206,
  title = {Fault Mechanism Analysis of MEMS Gyroscopes Under High-Overload Environment},
  author = {Bin Yan and Zhongyang Guo and Yilong Chen and Jiantao Zhao and Yujun Yang and Shugang Zhang and Boyu Hao and Huiliang Cao},
  year = {2026},
  journal = {Micromachines},
  doi = {10.3390/mi17101206},
  url = {https://doi.org/10.3390/mi17101206}
}

RIS

TY  - JOUR
TI  - Fault Mechanism Analysis of MEMS Gyroscopes Under High-Overload Environment
AU  - Bin Yan
AU  - Zhongyang Guo
AU  - Yilong Chen
AU  - Jiantao Zhao
AU  - Yujun Yang
AU  - Shugang Zhang
AU  - Boyu Hao
AU  - Huiliang Cao
PY  - 2026
JO  - Micromachines
DO  - 10.3390/mi17101206
UR  - https://doi.org/10.3390/mi17101206
ER  -

APA

Yan, B., Guo, Z., Chen, Y., Zhao, J., Yang, Y., Zhang, S., Hao, B., & Cao, H. (2026). Fault Mechanism Analysis of MEMS Gyroscopes Under High-Overload Environment. Micromachines. https://doi.org/10.3390/mi17101206

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crossref · retrieved 2026-11-09T17:45:40.340Z