The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO(2) Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect.
- DOI
- 10.3390/molecules26113230
- Published
- 2021 May 27
- Container
- Molecules (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/molecules26113230,
title = {The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO(2) Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect.},
author = {Nachaithong T and Chanlek N and Moontragoon P and Thongbai P},
year = {2021},
journal = {Molecules (Basel, Switzerland)},
doi = {10.3390/molecules26113230},
url = {https://doi.org/10.3390/molecules26113230}
}RIS
TY - JOUR TI - The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO(2) Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. AU - Nachaithong T AU - Chanlek N AU - Moontragoon P AU - Thongbai P PY - 2021 JO - Molecules (Basel, Switzerland) DO - 10.3390/molecules26113230 UR - https://doi.org/10.3390/molecules26113230 ER -
APA
T, N., N, C., P, M., & P, T. (2021). The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO(2) Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect.. Molecules (Basel, Switzerland). https://doi.org/10.3390/molecules26113230
Source records
- pubmed · retrieved 2026-11-10T07:54:08.009Z