Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum

Dorian Minkov, George Angelov, Dimitar Nikolov, Rostislav Rusev, Eduardo Blanco, Susana Fernandez, Manuel Ballester, Emilio Marquez

Open source

DOI
10.3390/molecules31091469
Published
2026-04-28
Container
Molecules
Publisher
MDPI AG
Open access
unknown

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BibTeX

@article{allodium:10.3390/molecules31091469,
  title = {Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum},
  author = {Dorian Minkov and George Angelov and Dimitar Nikolov and Rostislav Rusev and Eduardo Blanco and Susana Fernandez and Manuel Ballester and Emilio Marquez},
  year = {2026},
  journal = {Molecules},
  doi = {10.3390/molecules31091469},
  url = {https://doi.org/10.3390/molecules31091469}
}

RIS

TY  - JOUR
TI  - Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum
AU  - Dorian Minkov
AU  - George Angelov
AU  - Dimitar Nikolov
AU  - Rostislav Rusev
AU  - Eduardo Blanco
AU  - Susana Fernandez
AU  - Manuel Ballester
AU  - Emilio Marquez
PY  - 2026
JO  - Molecules
DO  - 10.3390/molecules31091469
UR  - https://doi.org/10.3390/molecules31091469
ER  - 

APA

Minkov, D., Angelov, G., Nikolov, D., Rusev, R., Blanco, E., Fernandez, S., Ballester, M., & Marquez, E. (2026). Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum. Molecules. https://doi.org/10.3390/molecules31091469

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