Stability of Wafer-Scale Thin Films of Vertically Aligned Hexagonal BN Nanosheets Exposed to High-Energy Ions and Reactive Atomic Oxygen.

Huang S, Ng ZK, Li H, Chaturvedi A, Lim JWM, Tay RY, Teo EHT, Xu S, Ostrikov KK, Tsang SH

Open source

DOI
10.3390/nano12213876
Published
2022 Nov 2
Container
Nanomaterials (Basel, Switzerland)
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.3390/nano12213876,
  title = {Stability of Wafer-Scale Thin Films of Vertically Aligned Hexagonal BN Nanosheets Exposed to High-Energy Ions and Reactive Atomic Oxygen.},
  author = {Huang S and Ng ZK and Li H and Chaturvedi A and Lim JWM and Tay RY and Teo EHT and Xu S and Ostrikov KK and Tsang SH},
  year = {2022},
  journal = {Nanomaterials (Basel, Switzerland)},
  doi = {10.3390/nano12213876},
  url = {https://doi.org/10.3390/nano12213876}
}

RIS

TY  - JOUR
TI  - Stability of Wafer-Scale Thin Films of Vertically Aligned Hexagonal BN Nanosheets Exposed to High-Energy Ions and Reactive Atomic Oxygen.
AU  - Huang S
AU  - Ng ZK
AU  - Li H
AU  - Chaturvedi A
AU  - Lim JWM
AU  - Tay RY
AU  - Teo EHT
AU  - Xu S
AU  - Ostrikov KK
AU  - Tsang SH
PY  - 2022
JO  - Nanomaterials (Basel, Switzerland)
DO  - 10.3390/nano12213876
UR  - https://doi.org/10.3390/nano12213876
ER  - 

APA

S, H., ZK, N., H, L., A, C., JWM, L., RY, T., EHT, T., S, X., KK, O., & SH, T. (2022). Stability of Wafer-Scale Thin Films of Vertically Aligned Hexagonal BN Nanosheets Exposed to High-Energy Ions and Reactive Atomic Oxygen.. Nanomaterials (Basel, Switzerland). https://doi.org/10.3390/nano12213876

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