Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review.

Liu Q, Chen Y, Zhou Q, Jiang J, Luo F, Wu F, Guo C, Zhu Z, Chen D

DOI: 10.3390/nano16140890
Published: 2026 Jul 20
Container: Nanomaterials (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/nano16140890,
  title = {Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review.},
  author = {Liu Q and Chen Y and Zhou Q and Jiang J and Luo F and Wu F and Guo C and Zhu Z and Chen D},
  year = {2026},
  journal = {Nanomaterials (Basel, Switzerland)},
  doi = {10.3390/nano16140890},
  url = {https://doi.org/10.3390/nano16140890}
}

RIS

TY  - JOUR
TI  - Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review.
AU  - Liu Q
AU  - Chen Y
AU  - Zhou Q
AU  - Jiang J
AU  - Luo F
AU  - Wu F
AU  - Guo C
AU  - Zhu Z
AU  - Chen D
PY  - 2026
JO  - Nanomaterials (Basel, Switzerland)
DO  - 10.3390/nano16140890
UR  - https://doi.org/10.3390/nano16140890
ER  -

APA

Q, L., Y, C., Q, Z., J, J., F, L., F, W., C, G., Z, Z., & D, C. (2026). Nanosphere Self-Assembly Imaging Systems and Defect Detection Algorithms for Self-Assembled Structures: A Review.. Nanomaterials (Basel, Switzerland). https://doi.org/10.3390/nano16140890

Source records

pubmed · retrieved 2026-11-10T12:03:31.937Z