PWDD-Net: A Patterned Wafer Defect Detection Network for Semiconductor Manufacturing.

Kong W, Zhang W, Qin L, Gong D

Open source

DOI: 10.3390/nano16161026
Published: 2026 Aug 19
Container: Nanomaterials (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

Credibility signals

uncertain Score 53/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
supportingDirectory of Open Access Journals: A matching record was returned by DOAJ. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
supportingOpen access status: Normalized open-access status: open. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.3390/nano16161026,
  title = {PWDD-Net: A Patterned Wafer Defect Detection Network for Semiconductor Manufacturing.},
  author = {Kong W and Zhang W and Qin L and Gong D},
  year = {2026},
  journal = {Nanomaterials (Basel, Switzerland)},
  doi = {10.3390/nano16161026},
  url = {https://doi.org/10.3390/nano16161026}
}

RIS

TY  - JOUR
TI  - PWDD-Net: A Patterned Wafer Defect Detection Network for Semiconductor Manufacturing.
AU  - Kong W
AU  - Zhang W
AU  - Qin L
AU  - Gong D
PY  - 2026
JO  - Nanomaterials (Basel, Switzerland)
DO  - 10.3390/nano16161026
UR  - https://doi.org/10.3390/nano16161026
ER  -

APA

W, K., W, Z., L, Q., & D, G. (2026). PWDD-Net: A Patterned Wafer Defect Detection Network for Semiconductor Manufacturing.. Nanomaterials (Basel, Switzerland). https://doi.org/10.3390/nano16161026

Source records

pubmed · retrieved 2026-09-25T11:26:59.660Z
europe-pmc · retrieved 2026-09-25T11:26:59.672Z
doaj · retrieved 2026-09-25T11:26:59.655Z