Empirical Validation of SNR-Dependent Deep Learning Architectures for Label-Free Super-Resolution in Optical Microscopy.

Kaderuppan SS, Mar JD, Irvine AC, Sharma A, Saifuddin MR, Wong WLE, Woo WL

Open source

DOI
10.3390/nano16201334
Published
2026 Oct 21
Container
Nanomaterials (Basel, Switzerland)
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.3390/nano16201334,
  title = {Empirical Validation of SNR-Dependent Deep Learning Architectures for Label-Free Super-Resolution in Optical Microscopy.},
  author = {Kaderuppan SS and Mar JD and Irvine AC and Sharma A and Saifuddin MR and Wong WLE and Woo WL},
  year = {2026},
  journal = {Nanomaterials (Basel, Switzerland)},
  doi = {10.3390/nano16201334},
  url = {https://doi.org/10.3390/nano16201334}
}

RIS

TY  - JOUR
TI  - Empirical Validation of SNR-Dependent Deep Learning Architectures for Label-Free Super-Resolution in Optical Microscopy.
AU  - Kaderuppan SS
AU  - Mar JD
AU  - Irvine AC
AU  - Sharma A
AU  - Saifuddin MR
AU  - Wong WLE
AU  - Woo WL
PY  - 2026
JO  - Nanomaterials (Basel, Switzerland)
DO  - 10.3390/nano16201334
UR  - https://doi.org/10.3390/nano16201334
ER  - 

APA

SS, K., JD, M., AC, I., A, S., MR, S., WLE, W., & WL, W. (2026). Empirical Validation of SNR-Dependent Deep Learning Architectures for Label-Free Super-Resolution in Optical Microscopy.. Nanomaterials (Basel, Switzerland). https://doi.org/10.3390/nano16201334

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