Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.

Arezki Y, Su R, Heikkinen V, Leprete F, Posta P, Bitou Y, Schober C, Mehdi-Souzani C, Alzahrani BAM, Zhang X, Kondo Y, Pruss C, Ledl V, Anwer N, Bouazizi ML, Leach R, Nouira H.

Open source

DOI: 10.3390/s21041103
Published: 2021-02-05
Container: Sensors (Basel)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s21041103,
  title = {Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.},
  author = {Arezki Y and  Su R and  Heikkinen V and  Leprete F and  Posta P and  Bitou Y and  Schober C and  Mehdi-Souzani C and  Alzahrani BAM and  Zhang X and  Kondo Y and  Pruss C and  Ledl V and  Anwer N and  Bouazizi ML and  Leach R and  Nouira H.},
  year = {2021},
  journal = {Sensors (Basel)},
  doi = {10.3390/s21041103},
  url = {https://doi.org/10.3390/s21041103}
}

RIS

TY  - JOUR
TI  - Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.
AU  - Arezki Y
AU  -  Su R
AU  -  Heikkinen V
AU  -  Leprete F
AU  -  Posta P
AU  -  Bitou Y
AU  -  Schober C
AU  -  Mehdi-Souzani C
AU  -  Alzahrani BAM
AU  -  Zhang X
AU  -  Kondo Y
AU  -  Pruss C
AU  -  Ledl V
AU  -  Anwer N
AU  -  Bouazizi ML
AU  -  Leach R
AU  -  Nouira H.
PY  - 2021
JO  - Sensors (Basel)
DO  - 10.3390/s21041103
UR  - https://doi.org/10.3390/s21041103
ER  -

APA

Y, A., R, S., V, H., F, L., P, P., Y, B., C, S., C, M., BAM, A., X, Z., Y, K., C, P., V, L., N, A., ML, B., R, L., & H., N. (2021). Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.. Sensors (Basel). https://doi.org/10.3390/s21041103

Source records

europe-pmc · retrieved 2026-09-26T21:39:56.558Z
doaj · retrieved 2026-09-26T21:39:56.549Z