Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma.

Cho C, Kim S, Lee Y, Jeong W, Seong I, Lee J, Choi M, You Y, Lee S, Lee J, You S

DOI: 10.3390/s22176589
Published: 2022 Aug 31
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s22176589,
  title = {Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma.},
  author = {Cho C and Kim S and Lee Y and Jeong W and Seong I and Lee J and Choi M and You Y and Lee S and Lee J and You S},
  year = {2022},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s22176589},
  url = {https://doi.org/10.3390/s22176589}
}

RIS

TY  - JOUR
TI  - Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma.
AU  - Cho C
AU  - Kim S
AU  - Lee Y
AU  - Jeong W
AU  - Seong I
AU  - Lee J
AU  - Choi M
AU  - You Y
AU  - Lee S
AU  - Lee J
AU  - You S
PY  - 2022
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s22176589
UR  - https://doi.org/10.3390/s22176589
ER  -

APA

C, C., S, K., Y, L., W, J., I, S., J, L., M, C., Y, Y., S, L., J, L., & S, Y. (2022). Refined Appearance Potential Mass Spectrometry for High Precision Radical Density Quantification in Plasma.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s22176589

Source records

pubmed · retrieved 2026-09-24T22:14:21.859Z