Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification.
- DOI
- 10.3390/s23041926
- Published
- 2023 Feb 8
- Container
- Sensors (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/s23041926,
title = {Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification.},
author = {Shin E and Yoo CD},
year = {2023},
journal = {Sensors (Basel, Switzerland)},
doi = {10.3390/s23041926},
url = {https://doi.org/10.3390/s23041926}
}RIS
TY - JOUR TI - Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification. AU - Shin E AU - Yoo CD PY - 2023 JO - Sensors (Basel, Switzerland) DO - 10.3390/s23041926 UR - https://doi.org/10.3390/s23041926 ER -
APA
E, S., & CD, Y. (2023). Efficient Convolutional Neural Networks for Semiconductor Wafer Bin Map Classification.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s23041926
Source records
- pubmed · retrieved 2026-09-25T03:45:05.269Z