Analysis of Training Deep Learning Models for PCB Defect Detection.

Park JH, Kim YS, Seo H, Cho YJ

DOI: 10.3390/s23052766
Published: 2023 Mar 2
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s23052766,
  title = {Analysis of Training Deep Learning Models for PCB Defect Detection.},
  author = {Park JH and Kim YS and Seo H and Cho YJ},
  year = {2023},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s23052766},
  url = {https://doi.org/10.3390/s23052766}
}

RIS

TY  - JOUR
TI  - Analysis of Training Deep Learning Models for PCB Defect Detection.
AU  - Park JH
AU  - Kim YS
AU  - Seo H
AU  - Cho YJ
PY  - 2023
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s23052766
UR  - https://doi.org/10.3390/s23052766
ER  -

APA

JH, P., YS, K., H, S., & YJ, C. (2023). Analysis of Training Deep Learning Models for PCB Defect Detection.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s23052766

Source records

pubmed · retrieved 2026-09-26T21:41:17.956Z