Bypassing Heaven’s Gate Technique Using Black-Box Testing

Seon-Jin Hwang, Assem Utaliyeva, Jae-Seok Kim, Yoon-Ho Choi

Open source

DOI: 10.3390/s23239417
Published: 2023-11-26
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s23239417,
  title = {Bypassing Heaven’s Gate Technique Using Black-Box Testing},
  author = {Seon-Jin Hwang and Assem Utaliyeva and Jae-Seok Kim and Yoon-Ho Choi},
  year = {2023},
  journal = {Sensors},
  doi = {10.3390/s23239417},
  url = {https://doi.org/10.3390/s23239417}
}

RIS

TY  - JOUR
TI  - Bypassing Heaven’s Gate Technique Using Black-Box Testing
AU  - Seon-Jin Hwang
AU  - Assem Utaliyeva
AU  - Jae-Seok Kim
AU  - Yoon-Ho Choi
PY  - 2023
JO  - Sensors
DO  - 10.3390/s23239417
UR  - https://doi.org/10.3390/s23239417
ER  -

APA

Hwang, S., Utaliyeva, A., Kim, J., & Choi, Y. (2023). Bypassing Heaven’s Gate Technique Using Black-Box Testing. Sensors. https://doi.org/10.3390/s23239417

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crossref · retrieved 2026-09-25T17:43:14.155Z