Contrastive Learning with Global and Local Representation for Mixed-Type Wafer Defect Recognition

Shantong Yin, Yangkun Zhang, Rui Wang

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DOI: 10.3390/s25041272
Published: 2025-02-19
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s25041272,
  title = {Contrastive Learning with Global and Local Representation for Mixed-Type Wafer Defect Recognition},
  author = {Shantong Yin and Yangkun Zhang and Rui Wang},
  year = {2025},
  journal = {Sensors},
  doi = {10.3390/s25041272},
  url = {https://doi.org/10.3390/s25041272}
}

RIS

TY  - JOUR
TI  - Contrastive Learning with Global and Local Representation for Mixed-Type Wafer Defect Recognition
AU  - Shantong Yin
AU  - Yangkun Zhang
AU  - Rui Wang
PY  - 2025
JO  - Sensors
DO  - 10.3390/s25041272
UR  - https://doi.org/10.3390/s25041272
ER  -

APA

Yin, S., Zhang, Y., & Wang, R. (2025). Contrastive Learning with Global and Local Representation for Mixed-Type Wafer Defect Recognition. Sensors. https://doi.org/10.3390/s25041272

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crossref · retrieved 2026-09-25T06:32:31.127Z