Single-Crystal Inspection Using an Adapted Total Focusing Method.

Aizpurua-Maestre I, De Miguel A, Lanzagorta JL, Carcreff E, Galdos L

DOI: 10.3390/s25103157
Published: 2025 May 17
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s25103157,
  title = {Single-Crystal Inspection Using an Adapted Total Focusing Method.},
  author = {Aizpurua-Maestre I and De Miguel A and Lanzagorta JL and Carcreff E and Galdos L},
  year = {2025},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s25103157},
  url = {https://doi.org/10.3390/s25103157}
}

RIS

TY  - JOUR
TI  - Single-Crystal Inspection Using an Adapted Total Focusing Method.
AU  - Aizpurua-Maestre I
AU  - De Miguel A
AU  - Lanzagorta JL
AU  - Carcreff E
AU  - Galdos L
PY  - 2025
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s25103157
UR  - https://doi.org/10.3390/s25103157
ER  -

APA

I, A., A, D. M., JL, L., E, C., & L, G. (2025). Single-Crystal Inspection Using an Adapted Total Focusing Method.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s25103157

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pubmed · retrieved 2026-09-26T03:39:59.524Z