Optical Microscopy for High-Resolution IPMC Displacement Measurement.

Minas D, Tsiakmakis K, Hatzopoulos AT, Tsintotas KA, Vassios V, Papadopoulou MS

DOI: 10.3390/s26020436
Published: 2026 Jan 9
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26020436,
  title = {Optical Microscopy for High-Resolution IPMC Displacement Measurement.},
  author = {Minas D and Tsiakmakis K and Hatzopoulos AT and Tsintotas KA and Vassios V and Papadopoulou MS},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26020436},
  url = {https://doi.org/10.3390/s26020436}
}

RIS

TY  - JOUR
TI  - Optical Microscopy for High-Resolution IPMC Displacement Measurement.
AU  - Minas D
AU  - Tsiakmakis K
AU  - Hatzopoulos AT
AU  - Tsintotas KA
AU  - Vassios V
AU  - Papadopoulou MS
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26020436
UR  - https://doi.org/10.3390/s26020436
ER  -

APA

D, M., K, T., AT, H., KA, T., V, V., & MS, P. (2026). Optical Microscopy for High-Resolution IPMC Displacement Measurement.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26020436

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pubmed · retrieved 2026-11-10T14:23:10.696Z