Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications.

Mehrad M, Zareiee M

DOI: 10.3390/s26041171
Published: 2026 Feb 11
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26041171,
  title = {Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications.},
  author = {Mehrad M and Zareiee M},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26041171},
  url = {https://doi.org/10.3390/s26041171}
}

RIS

TY  - JOUR
TI  - Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications.
AU  - Mehrad M
AU  - Zareiee M
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26041171
UR  - https://doi.org/10.3390/s26041171
ER  -

APA

M, M., & M, Z. (2026). Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26041171

Source records

pubmed · retrieved 2026-11-10T07:01:18.785Z