Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules
- DOI
- 10.3390/s26061964
- Published
- 2026-03-21
- Container
- Sensors
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/s26061964,
title = {Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules},
author = {Yukai Hao and Jiao Wu and Zhiheng Zhang and Yuanhao Wang and Tao Wang and Yujie Liang},
year = {2026},
journal = {Sensors},
doi = {10.3390/s26061964},
url = {https://doi.org/10.3390/s26061964}
}RIS
TY - JOUR TI - Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules AU - Yukai Hao AU - Jiao Wu AU - Zhiheng Zhang AU - Yuanhao Wang AU - Tao Wang AU - Yujie Liang PY - 2026 JO - Sensors DO - 10.3390/s26061964 UR - https://doi.org/10.3390/s26061964 ER -
APA
Hao, Y., Wu, J., Zhang, Z., Wang, Y., Wang, T., & Liang, Y. (2026). Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules. Sensors. https://doi.org/10.3390/s26061964
Source records
- crossref · retrieved 2026-11-10T07:15:56.034Z