Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules.

Hao Y, Wu J, Zhang Z, Wang Y, Wang T, Liang Y

DOI: 10.3390/s26061964
Published: 2026 Mar 21
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26061964,
  title = {Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules.},
  author = {Hao Y and Wu J and Zhang Z and Wang Y and Wang T and Liang Y},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26061964},
  url = {https://doi.org/10.3390/s26061964}
}

RIS

TY  - JOUR
TI  - Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules.
AU  - Hao Y
AU  - Wu J
AU  - Zhang Z
AU  - Wang Y
AU  - Wang T
AU  - Liang Y
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26061964
UR  - https://doi.org/10.3390/s26061964
ER  -

APA

Y, H., J, W., Z, Z., Y, W., T, W., & Y, L. (2026). Genetic Algorithm-Optimized CNN-BiLSTM Framework for Predicting the Remaining Useful Life of IGBT Modules.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26061964

Source records

pubmed · retrieved 2026-09-25T21:12:16.319Z