A Deep Learning-Based Method for Stress Measurement Using Longitudinal Critically Refracted Waves.

Gan Y, Ma J, Zhang B, Zheng Y, Wang X, Zhu Y, Wang Y, Ji D

DOI: 10.3390/s26072283
Published: 2026 Apr 7
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26072283,
  title = {A Deep Learning-Based Method for Stress Measurement Using Longitudinal Critically Refracted Waves.},
  author = {Gan Y and Ma J and Zhang B and Zheng Y and Wang X and Zhu Y and Wang Y and Ji D},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26072283},
  url = {https://doi.org/10.3390/s26072283}
}

RIS

TY  - JOUR
TI  - A Deep Learning-Based Method for Stress Measurement Using Longitudinal Critically Refracted Waves.
AU  - Gan Y
AU  - Ma J
AU  - Zhang B
AU  - Zheng Y
AU  - Wang X
AU  - Zhu Y
AU  - Wang Y
AU  - Ji D
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26072283
UR  - https://doi.org/10.3390/s26072283
ER  -

APA

Y, G., J, M., B, Z., Y, Z., X, W., Y, Z., Y, W., & D, J. (2026). A Deep Learning-Based Method for Stress Measurement Using Longitudinal Critically Refracted Waves.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26072283

Source records

pubmed · retrieved 2026-09-25T04:50:08.040Z