Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection

Xiaoyuan Jiang, Bohan Jia, Yanhua Sun

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DOI: 10.3390/s26134312
Published: 2026-07-07
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s26134312,
  title = {Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection},
  author = {Xiaoyuan Jiang and Bohan Jia and Yanhua Sun},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26134312},
  url = {https://doi.org/10.3390/s26134312}
}

RIS

TY  - JOUR
TI  - Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection
AU  - Xiaoyuan Jiang
AU  - Bohan Jia
AU  - Yanhua Sun
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26134312
UR  - https://doi.org/10.3390/s26134312
ER  -

APA

Jiang, X., Jia, B., & Sun, Y. (2026). Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection. Sensors. https://doi.org/10.3390/s26134312

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crossref · retrieved 2026-09-26T10:51:36.624Z