Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection.

Jiang X, Jia B, Sun Y

DOI: 10.3390/s26134312
Published: 2026 Jul 7
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26134312,
  title = {Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection.},
  author = {Jiang X and Jia B and Sun Y},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26134312},
  url = {https://doi.org/10.3390/s26134312}
}

RIS

TY  - JOUR
TI  - Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection.
AU  - Jiang X
AU  - Jia B
AU  - Sun Y
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26134312
UR  - https://doi.org/10.3390/s26134312
ER  -

APA

X, J., B, J., & Y, S. (2026). Eddy-Current-Induced Waveform Reconstruction by Metallic Probe Carriers in Magnetic Flux Leakage Inspection.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26134312

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pubmed · retrieved 2026-11-11T00:09:22.175Z