MCM-YOLO: A Lightweight Conflict Mitigation Network for Industrial Metal Surface Defect Detection.

Zhang S, He K, Xu J, Sha H, Chen Z

DOI: 10.3390/s26144349
Published: 2026 Jul 9
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26144349,
  title = {MCM-YOLO: A Lightweight Conflict Mitigation Network for Industrial Metal Surface Defect Detection.},
  author = {Zhang S and He K and Xu J and Sha H and Chen Z},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26144349},
  url = {https://doi.org/10.3390/s26144349}
}

RIS

TY  - JOUR
TI  - MCM-YOLO: A Lightweight Conflict Mitigation Network for Industrial Metal Surface Defect Detection.
AU  - Zhang S
AU  - He K
AU  - Xu J
AU  - Sha H
AU  - Chen Z
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26144349
UR  - https://doi.org/10.3390/s26144349
ER  -

APA

S, Z., K, H., J, X., H, S., & Z, C. (2026). MCM-YOLO: A Lightweight Conflict Mitigation Network for Industrial Metal Surface Defect Detection.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26144349

Source records

pubmed · retrieved 2026-09-25T18:44:50.457Z