Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers
- DOI
- 10.3390/s26144443
- Published
- 2026-07-13
- Container
- Sensors
- Publisher
- MDPI AG
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.3390/s26144443,
title = {Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers},
author = {Jun Zhou and Ning Hu and Weifeng Yuan and Hui Hu and Kaiyan Huang and Jishuo Wang},
year = {2026},
journal = {Sensors},
doi = {10.3390/s26144443},
url = {https://doi.org/10.3390/s26144443}
}RIS
TY - JOUR TI - Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers AU - Jun Zhou AU - Ning Hu AU - Weifeng Yuan AU - Hui Hu AU - Kaiyan Huang AU - Jishuo Wang PY - 2026 JO - Sensors DO - 10.3390/s26144443 UR - https://doi.org/10.3390/s26144443 ER -
APA
Zhou, J., Hu, N., Yuan, W., Hu, H., Huang, K., & Wang, J. (2026). Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers. Sensors. https://doi.org/10.3390/s26144443
Source records
- crossref · retrieved 2026-09-24T17:16:58.577Z