Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers

Jun Zhou, Ning Hu, Weifeng Yuan, Hui Hu, Kaiyan Huang, Jishuo Wang

Open source

DOI
10.3390/s26144443
Published
2026-07-13
Container
Sensors
Publisher
MDPI AG
Open access
unknown

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BibTeX

@article{allodium:10.3390/s26144443,
  title = {Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers},
  author = {Jun Zhou and Ning Hu and Weifeng Yuan and Hui Hu and Kaiyan Huang and Jishuo Wang},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26144443},
  url = {https://doi.org/10.3390/s26144443}
}

RIS

TY  - JOUR
TI  - Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers
AU  - Jun Zhou
AU  - Ning Hu
AU  - Weifeng Yuan
AU  - Hui Hu
AU  - Kaiyan Huang
AU  - Jishuo Wang
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26144443
UR  - https://doi.org/10.3390/s26144443
ER  - 

APA

Zhou, J., Hu, N., Yuan, W., Hu, H., Huang, K., & Wang, J. (2026). Cut-Dependent Topology Optimization for Enhancing Shear-Mode Purity in Lithium Niobate Wafers. Sensors. https://doi.org/10.3390/s26144443

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