A Corner-Analysis-Based Method for Dimensional Inspection and Defect Detection of Glass Chamfers.

Jiang J, Wang T, Zhou Y, Wang W, Wu C, Wei B

DOI: 10.3390/s26154764
Published: 2026 Jul 27
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26154764,
  title = {A Corner-Analysis-Based Method for Dimensional Inspection and Defect Detection of Glass Chamfers.},
  author = {Jiang J and Wang T and Zhou Y and Wang W and Wu C and Wei B},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26154764},
  url = {https://doi.org/10.3390/s26154764}
}

RIS

TY  - JOUR
TI  - A Corner-Analysis-Based Method for Dimensional Inspection and Defect Detection of Glass Chamfers.
AU  - Jiang J
AU  - Wang T
AU  - Zhou Y
AU  - Wang W
AU  - Wu C
AU  - Wei B
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26154764
UR  - https://doi.org/10.3390/s26154764
ER  -

APA

J, J., T, W., Y, Z., W, W., C, W., & B, W. (2026). A Corner-Analysis-Based Method for Dimensional Inspection and Defect Detection of Glass Chamfers.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26154764

Source records

pubmed · retrieved 2026-09-24T21:21:23.846Z