Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution

Jonathan Ehrmann, Oliver Radler, Thomas Sattel

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DOI: 10.3390/s26154791
Published: 2026-07-28
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s26154791,
  title = {Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution},
  author = {Jonathan Ehrmann and Oliver Radler and Thomas Sattel},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26154791},
  url = {https://doi.org/10.3390/s26154791}
}

RIS

TY  - JOUR
TI  - Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution
AU  - Jonathan Ehrmann
AU  - Oliver Radler
AU  - Thomas Sattel
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26154791
UR  - https://doi.org/10.3390/s26154791
ER  -

APA

Ehrmann, J., Radler, O., & Sattel, T. (2026). Utilization of Nonlinear Parametric Resonance in Micro Sensor Probes to Enhance Atomic Force Microscope Resolution. Sensors. https://doi.org/10.3390/s26154791

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crossref · retrieved 2026-11-03T20:39:37.453Z