System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System.

Luo D, Han Z, Zhu S, Yue S

DOI: 10.3390/s26154951
Published: 2026 Aug 5
Container: Sensors (Basel, Switzerland)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.3390/s26154951,
  title = {System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System.},
  author = {Luo D and Han Z and Zhu S and Yue S},
  year = {2026},
  journal = {Sensors (Basel, Switzerland)},
  doi = {10.3390/s26154951},
  url = {https://doi.org/10.3390/s26154951}
}

RIS

TY  - JOUR
TI  - System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System.
AU  - Luo D
AU  - Han Z
AU  - Zhu S
AU  - Yue S
PY  - 2026
JO  - Sensors (Basel, Switzerland)
DO  - 10.3390/s26154951
UR  - https://doi.org/10.3390/s26154951
ER  -

APA

D, L., Z, H., S, Z., & S, Y. (2026). System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26154951

Source records

pubmed · retrieved 2026-11-10T09:12:26.163Z