System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System

Donghua Luo, Zhaoyou Han, Shiyuan Zhu, Shihong Yue

Open source

DOI: 10.3390/s26154951
Published: 2026-08-05
Container: Sensors
Publisher: MDPI AG
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.3390/s26154951,
  title = {System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System},
  author = {Donghua Luo and Zhaoyou Han and Shiyuan Zhu and Shihong Yue},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26154951},
  url = {https://doi.org/10.3390/s26154951}
}

RIS

TY  - JOUR
TI  - System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System
AU  - Donghua Luo
AU  - Zhaoyou Han
AU  - Shiyuan Zhu
AU  - Shihong Yue
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26154951
UR  - https://doi.org/10.3390/s26154951
ER  -

APA

Luo, D., Han, Z., Zhu, S., & Yue, S. (2026). System-Level Integration and Evaluation of an APS-SoC-Based Electrical Resistance Tomography Measurement System. Sensors. https://doi.org/10.3390/s26154951

Source records

crossref · retrieved 2026-09-25T23:40:28.751Z