Loose Particle Material Identification for Sealed Electronic Devices Using Pulse Endpoint Detection and CEEMDAN Feature Optimization.
- DOI
- 10.3390/s26185875
- Published
- 2026 Sep 16
- Container
- Sensors (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/s26185875,
title = {Loose Particle Material Identification for Sealed Electronic Devices Using Pulse Endpoint Detection and CEEMDAN Feature Optimization.},
author = {Ren Z and Wang K and Lu Y and Song S and Zou X},
year = {2026},
journal = {Sensors (Basel, Switzerland)},
doi = {10.3390/s26185875},
url = {https://doi.org/10.3390/s26185875}
}RIS
TY - JOUR TI - Loose Particle Material Identification for Sealed Electronic Devices Using Pulse Endpoint Detection and CEEMDAN Feature Optimization. AU - Ren Z AU - Wang K AU - Lu Y AU - Song S AU - Zou X PY - 2026 JO - Sensors (Basel, Switzerland) DO - 10.3390/s26185875 UR - https://doi.org/10.3390/s26185875 ER -
APA
Z, R., K, W., Y, L., S, S., & X, Z. (2026). Loose Particle Material Identification for Sealed Electronic Devices Using Pulse Endpoint Detection and CEEMDAN Feature Optimization.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26185875
Source records
- pubmed · retrieved 2026-11-10T08:04:43.149Z