Fault Diagnosis of Semiconductor Detectors Using a Radial Basis Function Neural Network with Bayesian Optimization and K-Means Clustering.
- DOI
- 10.3390/s26196116
- Published
- 2026 Sep 26
- Container
- Sensors (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/s26196116,
title = {Fault Diagnosis of Semiconductor Detectors Using a Radial Basis Function Neural Network with Bayesian Optimization and K-Means Clustering.},
author = {Xie Y and Yan R and Li X and Shi J and Zheng H and Xu W and Gong D and Tang S and Tan Y and Xu Y},
year = {2026},
journal = {Sensors (Basel, Switzerland)},
doi = {10.3390/s26196116},
url = {https://doi.org/10.3390/s26196116}
}RIS
TY - JOUR TI - Fault Diagnosis of Semiconductor Detectors Using a Radial Basis Function Neural Network with Bayesian Optimization and K-Means Clustering. AU - Xie Y AU - Yan R AU - Li X AU - Shi J AU - Zheng H AU - Xu W AU - Gong D AU - Tang S AU - Tan Y AU - Xu Y PY - 2026 JO - Sensors (Basel, Switzerland) DO - 10.3390/s26196116 UR - https://doi.org/10.3390/s26196116 ER -
APA
Y, X., R, Y., X, L., J, S., H, Z., W, X., D, G., S, T., Y, T., & Y, X. (2026). Fault Diagnosis of Semiconductor Detectors Using a Radial Basis Function Neural Network with Bayesian Optimization and K-Means Clustering.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26196116
Source records
- pubmed · retrieved 2026-11-10T07:06:57.735Z