Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions.
- DOI
- 10.3390/s26196247
- Published
- 2026 Oct 1
- Container
- Sensors (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.3390/s26196247,
title = {Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions.},
author = {Yavuz S and Naroska E and Daniel K and Obermaisser R},
year = {2026},
journal = {Sensors (Basel, Switzerland)},
doi = {10.3390/s26196247},
url = {https://doi.org/10.3390/s26196247}
}RIS
TY - JOUR TI - Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions. AU - Yavuz S AU - Naroska E AU - Daniel K AU - Obermaisser R PY - 2026 JO - Sensors (Basel, Switzerland) DO - 10.3390/s26196247 UR - https://doi.org/10.3390/s26196247 ER -
APA
S, Y., E, N., K, D., & R, O. (2026). Investigating the Impact of Low-Rate Error-Correction Codes on Device-Cloning and Reverse-Engineering Attacks on Physical Unclonable Functions.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26196247
Source records
- pubmed · retrieved 2026-11-10T07:01:12.503Z