Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays.
- DOI
- 10.3390/s26196254
- Published
- 2026 Oct 2
- Container
- Sensors (Basel, Switzerland)
- Publisher
- Not recorded
- Open access
- yes
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BibTeX
@article{allodium:10.3390/s26196254,
title = {Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays.},
author = {El Abdi A and Martin-Gonthier P and Badefort-Baril V},
year = {2026},
journal = {Sensors (Basel, Switzerland)},
doi = {10.3390/s26196254},
url = {https://doi.org/10.3390/s26196254}
}RIS
TY - JOUR TI - Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays. AU - El Abdi A AU - Martin-Gonthier P AU - Badefort-Baril V PY - 2026 JO - Sensors (Basel, Switzerland) DO - 10.3390/s26196254 UR - https://doi.org/10.3390/s26196254 ER -
APA
A, E. A., P, M., & V, B. (2026). Investigation on Hot-Carrier Injection Mechanisms and Reliability Design-Based Strategies in Cryogenically Operated CMOS ROICs for Infrared Focal Plane Arrays.. Sensors (Basel, Switzerland). https://doi.org/10.3390/s26196254
Source records
- pubmed · retrieved 2026-11-10T07:07:15.430Z