Data-Driven Sparse Reconstruction Framework for Anomaly Detection in Smart Manufacturing Environment

Jung Kyu Park, Youngmi Baek

Open source

DOI: 10.3390/s26206523
Published: 2026-10-14
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s26206523,
  title = {Data-Driven Sparse Reconstruction Framework for Anomaly Detection in Smart Manufacturing Environment},
  author = {Jung Kyu Park and Youngmi Baek},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26206523},
  url = {https://doi.org/10.3390/s26206523}
}

RIS

TY  - JOUR
TI  - Data-Driven Sparse Reconstruction Framework for Anomaly Detection in Smart Manufacturing Environment
AU  - Jung Kyu Park
AU  - Youngmi Baek
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26206523
UR  - https://doi.org/10.3390/s26206523
ER  -

APA

Park, J. K., & Baek, Y. (2026). Data-Driven Sparse Reconstruction Framework for Anomaly Detection in Smart Manufacturing Environment. Sensors. https://doi.org/10.3390/s26206523

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crossref · retrieved 2026-11-03T20:26:37.544Z