Numerical Characterization of Optical Transmittance Through Planar Multilayer Dielectric Stacks on CMOS Photodiodes

João Fernandes, Gabriel M. Ferreira, João P. Carmo, Graça Minas, Susana O. Catarino

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DOI: 10.3390/s26206591
Published: 2026-10-17
Container: Sensors
Publisher: MDPI AG
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3390/s26206591,
  title = {Numerical Characterization of Optical Transmittance Through Planar Multilayer Dielectric Stacks on CMOS Photodiodes},
  author = {João Fernandes and Gabriel M. Ferreira and João P. Carmo and Graça Minas and Susana O. Catarino},
  year = {2026},
  journal = {Sensors},
  doi = {10.3390/s26206591},
  url = {https://doi.org/10.3390/s26206591}
}

RIS

TY  - JOUR
TI  - Numerical Characterization of Optical Transmittance Through Planar Multilayer Dielectric Stacks on CMOS Photodiodes
AU  - João Fernandes
AU  - Gabriel M. Ferreira
AU  - João P. Carmo
AU  - Graça Minas
AU  - Susana O. Catarino
PY  - 2026
JO  - Sensors
DO  - 10.3390/s26206591
UR  - https://doi.org/10.3390/s26206591
ER  -

APA

Fernandes, J., Ferreira, G. M., Carmo, J. P., Minas, G., & Catarino, S. O. (2026). Numerical Characterization of Optical Transmittance Through Planar Multilayer Dielectric Stacks on CMOS Photodiodes. Sensors. https://doi.org/10.3390/s26206591

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crossref · retrieved 2026-11-08T07:09:58.178Z