Oxygen Plasma Interface Engineering of Ti/n-GeSn Contacts for Ultra-Low Contact Resistivity
- DOI
- 10.34734/fzj-2026-05505
- Published
- 2026
- Container
- Not recorded
- Publisher
- Forschungzentrum Jülich
- Open access
- no
Credibility signals
limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- cautionDOI registered: No matching Crossref record was present in this response.
- cautionDOI resolves: No matching Crossref record was present in this response.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty.
Cite this work
BibTeX
@article{allodium:10.34734/fzj-2026-05505,
title = {Oxygen Plasma Interface Engineering of Ti/n-GeSn Contacts for Ultra-Low Contact Resistivity},
author = {Sun, Jingxuan and Han, Yi and Junk, Yannik and Bae, Jin Hee and Klingebiel, Benjamin and Grützmacher, Detlev and Buca, Dan and Zhao, Qing-Tai},
year = {2026},
doi = {10.34734/fzj-2026-05505},
url = {https://doi.org/10.34734/fzj-2026-05505}
}RIS
TY - JOUR TI - Oxygen Plasma Interface Engineering of Ti/n-GeSn Contacts for Ultra-Low Contact Resistivity AU - Sun, Jingxuan AU - Han, Yi AU - Junk, Yannik AU - Bae, Jin Hee AU - Klingebiel, Benjamin AU - Grützmacher, Detlev AU - Buca, Dan AU - Zhao, Qing-Tai PY - 2026 DO - 10.34734/fzj-2026-05505 UR - https://doi.org/10.34734/fzj-2026-05505 ER -
APA
Jingxuan, S., Yi, H., Yannik, J., Hee, B. J., Benjamin, K., Detlev, G., Dan, B., & Qing-Tai, Z. (2026). Oxygen Plasma Interface Engineering of Ti/n-GeSn Contacts for Ultra-Low Contact Resistivity. https://doi.org/10.34734/fzj-2026-05505
Source records
- datacite · retrieved 2026-11-10T13:24:15.485Z