Scanning probe microscopy for energy-related materials

Rüdiger Berger, Benjamin Grévin, Philippe Leclère, Yi Zhang

Open source

DOI: 10.3762/bjnano.10.12
Published: 2019-01-10
Container: Beilstein Journal of Nanotechnology
Publisher: Beilstein Institut
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3762/bjnano.10.12,
  title = {Scanning probe microscopy for energy-related materials},
  author = {Rüdiger Berger and Benjamin Grévin and Philippe Leclère and Yi Zhang},
  year = {2019},
  journal = {Beilstein Journal of Nanotechnology},
  doi = {10.3762/bjnano.10.12},
  url = {https://doi.org/10.3762/bjnano.10.12}
}

RIS

TY  - JOUR
TI  - Scanning probe microscopy for energy-related materials
AU  - Rüdiger Berger
AU  - Benjamin Grévin
AU  - Philippe Leclère
AU  - Yi Zhang
PY  - 2019
JO  - Beilstein Journal of Nanotechnology
DO  - 10.3762/bjnano.10.12
UR  - https://doi.org/10.3762/bjnano.10.12
ER  -

APA

Berger, R., Grévin, B., Leclère, P., & Zhang, Y. (2019). Scanning probe microscopy for energy-related materials. Beilstein Journal of Nanotechnology. https://doi.org/10.3762/bjnano.10.12

Source records

crossref · retrieved 2026-09-26T09:12:39.521Z