Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Wenting Wang, Chengfu Ma, Yuhang Chen, Lei Zheng, Huarong Liu, Jiaru Chu

Open source

DOI: 10.3762/bjnano.10.159
Published: 2019-08-07
Container: Beilstein Journal of Nanotechnology
Publisher: Beilstein Institut
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.3762/bjnano.10.159,
  title = {Subsurface imaging of flexible circuits via contact resonance atomic force microscopy},
  author = {Wenting Wang and Chengfu Ma and Yuhang Chen and Lei Zheng and Huarong Liu and Jiaru Chu},
  year = {2019},
  journal = {Beilstein Journal of Nanotechnology},
  doi = {10.3762/bjnano.10.159},
  url = {https://doi.org/10.3762/bjnano.10.159}
}

RIS

TY  - JOUR
TI  - Subsurface imaging of flexible circuits via contact resonance atomic force microscopy
AU  - Wenting Wang
AU  - Chengfu Ma
AU  - Yuhang Chen
AU  - Lei Zheng
AU  - Huarong Liu
AU  - Jiaru Chu
PY  - 2019
JO  - Beilstein Journal of Nanotechnology
DO  - 10.3762/bjnano.10.159
UR  - https://doi.org/10.3762/bjnano.10.159
ER  -

APA

Wang, W., Ma, C., Chen, Y., Zheng, L., Liu, H., & Chu, J. (2019). Subsurface imaging of flexible circuits via contact resonance atomic force microscopy. Beilstein Journal of Nanotechnology. https://doi.org/10.3762/bjnano.10.159

Source records

crossref · retrieved 2026-09-25T10:24:58.343Z