Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function

Perawat Boonpuek, Jonathan Robert Felts

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DOI: 10.3762/bxiv.2023.34.v1
Published: 2023-08-21
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Publisher: Beilstein Institut
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Cite this work

BibTeX

@article{allodium:10.3762/bxiv.2023.34.v1,
  title = {Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function},
  author = {Perawat Boonpuek and Jonathan Robert Felts},
  year = {2023},
  doi = {10.3762/bxiv.2023.34.v1},
  url = {https://doi.org/10.3762/bxiv.2023.34.v1}
}

RIS

TY  - JOUR
TI  - Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function
AU  - Perawat Boonpuek
AU  - Jonathan Robert Felts
PY  - 2023
DO  - 10.3762/bxiv.2023.34.v1
UR  - https://doi.org/10.3762/bxiv.2023.34.v1
ER  -

APA

Boonpuek, P., & Felts, J. R. (2023). Determination of the Radii of Coated and Uncoated Silicon AFM Sharp Tips using Height Calibration Standard Grating and Nonlinear Regression Function. https://doi.org/10.3762/bxiv.2023.34.v1

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