Implementation of Heterodyne-Detected Tapping-Mode Photothermal Atomic Force Microscopy-Infrared Spectroscopy for Semiconductor Materials and Devices.

Efaw CM, Batista S, Olaso NH, Bailey BR, Estrada D, Graugnard E, Davis PH

Open source

DOI
10.3791/71517
Published
2026 Aug 21
Container
Journal of visualized experiments : JoVE
Publisher
Not recorded
Open access
unknown

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BibTeX

@article{allodium:10.3791/71517,
  title = {Implementation of Heterodyne-Detected Tapping-Mode Photothermal Atomic Force Microscopy-Infrared Spectroscopy for Semiconductor Materials and Devices.},
  author = {Efaw CM and Batista S and Olaso NH and Bailey BR and Estrada D and Graugnard E and Davis PH},
  year = {2026},
  journal = {Journal of visualized experiments : JoVE},
  doi = {10.3791/71517},
  url = {https://doi.org/10.3791/71517}
}

RIS

TY  - JOUR
TI  - Implementation of Heterodyne-Detected Tapping-Mode Photothermal Atomic Force Microscopy-Infrared Spectroscopy for Semiconductor Materials and Devices.
AU  - Efaw CM
AU  - Batista S
AU  - Olaso NH
AU  - Bailey BR
AU  - Estrada D
AU  - Graugnard E
AU  - Davis PH
PY  - 2026
JO  - Journal of visualized experiments : JoVE
DO  - 10.3791/71517
UR  - https://doi.org/10.3791/71517
ER  - 

APA

CM, E., S, B., NH, O., BR, B., D, E., E, G., & PH, D. (2026). Implementation of Heterodyne-Detected Tapping-Mode Photothermal Atomic Force Microscopy-Infrared Spectroscopy for Semiconductor Materials and Devices.. Journal of visualized experiments : JoVE. https://doi.org/10.3791/71517

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